The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 1985
Filed:
Mar. 01, 1982
Francis H Smith, York, GB;
Vickers Limited, London, GB;
Abstract
In a measuring microscope for measuring the distance between line elements of an optical image, means are provided for forming from an image-carrying beam, carrying the optical image, further image beams in which light of respective complementary regions of the image-carrying beam is suppressed, to form respective distinct non-overlapping but adjacent image portions for viewing. Means are provided for then carrying out calibrated displacement of the adjacent image portions. Thus, a line element in one image portion can be brought into alignment with a line element of an adjacent image portion. The degree of calibrated adjustment required for this gives a measure of the distance between the two line elements on the object which is imaged. The microscope may be constituted so that means involved in the suppression of complementary regions of the image-carrying beam are readily removable so that overlapping images can be provided for viewing.