The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 1985

Filed:

Mar. 01, 1982
Applicant:
Inventors:

Tokuhiro Okada, Hyogoken, JP;

Masayoshi Hayashi, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
364555 ; 364416 ; 377 11 ; 324 714 ;
Abstract

A particle size distribution analyzer includes a detector adapted to detect particles by electrical or optical differences from a medium containing the particles in dispersion and generate signals proportionally to the sizes of the detected particles, a threshold circuit adapted to remove noises or fragmental signals from the detected signals so as to obtain pulse widths at a constant position, a gate circuit adapted to decide the passage or non-passage of the particles through the threshold circuit, a counter circuit adapted to count the number of the particles fed from the gate circuit, a memory connected to the counter circuit, an arithmetic circuit connected to the memory and the detector, a controller circuit connected to the gate circuit, the memory and the counter circuit, and means for displaying or recording the data stored in the memory.


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