The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 1985

Filed:

Mar. 29, 1982
Applicant:
Inventor:

Knut Fischer, Auetal, DE;

Assignee:

Hermann Heye, Obernkirchen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2502 / ; 356240 ;
Abstract

A device for detecting unacceptable defects in a neck area of hollow glass articles transported by a feeding element has a light source spaced from a path of feeding of the articles and arranged to illuminate the neck area of the latter, a projecting element arranged to project an image of the neck area of each of the glass articles, an image receiving element arranged to receive the projected image of the neck area and having a plurality of electrooptical elements, wherein the projecting element includes a mirror arranged to project the image of the neck area of each of the articles along a projecting axis which is transverse to the longitudinal axis of the device, and the electrooptical elements are arranged in a circle located in a plane normal to the projecting axis.


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