The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 1984

Filed:

Jul. 14, 1982
Applicant:
Inventor:

Stanley K Smith, Fenton, MI (US);

Assignee:

Eaton Corporation, Cleveland, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
7386219 ; 7386253 ;
Abstract

A method of testing an assembly which is adapted to move in a predetermined motion through a cycle including the steps of applying a controlled force to the assembly, dividing each cycle of the assembly into a plurality of increments, sensing the force applied to the assembly during each increment, sensing the difference between the highest force and the lowest force sensed during a particular increment, setting a differential force limit for a particular increment and comparing the sensed difference between the highest and lowest force sensed during a particular increment with the set differential force limit and generating a first signal representative of an unacceptable assembly if the sensed differential force is not within the differential force limit.


Find Patent Forward Citations

Smith, Stanley. (1984). Quality control method (U.S. Patent No. 4489617). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4489617

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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