The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 1984

Filed:

Jul. 06, 1982
Applicant:
Inventor:

Mark H McLeod, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; G01R / ;
U.S. Cl.
CPC ...
324 / ; 331 46 ; 331 57 ; 331D / ; 340653 ;
Abstract

A test circuit that is particularly suitable for inclusion on an LSI chip when testing a new technology or process. The circuit will enable accurate determination of the effects of loading on the turn-on and turn-off delays of one or more logic circuits on the chip. These determinations are based upon a comparison of the periods of different signals obtainable from the test circuit.


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