The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 1984
Filed:
Mar. 19, 1982
Applicant:
Inventor:
Toshiaki Fukuma, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356319 ;
Abstract
A spectrophotometer system including a monochrometer which scans a sample in a sample cell with discrete wavelengths of light, and measures intensity signals of at least two discrete wavelengths of light emitted from the sample. These measured intensity signals are base-line corrected by a computer with respect to reference intensity signals at corresponding wavelengths. The computer also calculates base-line corrected intensity signals for wavelengths of light intermediate said two wavelengths of light from the intensity signals of said two respective discrete wavelengths. All base-line corrected intensity signals are stored for analysis of the sample.