The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 1984
Filed:
May. 06, 1982
Applicant:
Inventor:
Mark P Claypool, Horseheads, NY (US);
Assignee:
Powers Manufacturing, Inc., Elmira, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C / ; G01N / ; H04N / ;
U.S. Cl.
CPC ...
209526 ; 2502 / ; 356240 ; 356428 ; 358106 ; 364507 ;
Abstract
Container flaws are detected by repetitively sampling the output of a photosensor at a controlled rate dependent on the speed of inspection. Samples are digitized and stored in memory on a first in, first out basis. First in (oldest) and last in (newest) samples are used to provide a sliding computation of the slope or rate of change of the photosensor output. The computed slope is compared to an empirically determined preselected number. Containers are rejected or accepted based on the results of the comparison.