The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 1984

Filed:

Sep. 30, 1982
Applicant:
Inventors:

Hans Kastl, Neustadt, DE;

Rainer Bauer, Herzogenaurach, DE;

Erich Modlich, Forchheim, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
73618 ; 73619 ; 73621 ; 414749 ;
Abstract

Analysis manipulator for non-destructive material testing, including a support device having a mounting flange, a precision coordinate-moving mechanism having at least two guide frames each including coordinate drives in the form of straight guides and a drive having a spindle and a nut being movable by the spindle along the straight guides, the guide frames including a first lower guide frame having a mounting flange being mountable to the mounting flange of the support device, a second guide frame being movable by the coordinate drive of the first guide frame in a first given coordinate direction, and a testing head mount being movable by the coordinate drive of the second guide frame in a second given coordinate direction, and a method for the coordinate control of the analysis manipulator.


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