The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 1984
Filed:
Apr. 13, 1982
Michael Fellhauer, Geislingen, DE;
Otto Holzinger, Eschenbach, DE;
Klaus Vits, Uhingen-Baiereck, DE;
Bert Wurst, M/o/ glingen, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
An address and data bus connects a multiplicity of ports into which test modules can be inserted with a microcomputer controlled by a keyboard for performing tests on circuit boards or other electronic units through test plugs that are interconnected with the data ports where the test modules are plugged in. When the test system is put into operation, all of the ports of the data bus are addressed to produce an indication of which ports are occupied by test modules as well as of the nature of the test modules. When it is desired to produce a test, each step of the procedure is performed by operation of a keyboard with reference to available options presented on the computer display on the basis of the configuration of test modules that have been plugged in. Coupling fields are interposed between data ports designed to receive test modules utilizing analog circuits and a test connector for connection to equipment under test. A coupling field has its own data port to enable switching the connection between the test module and the test plug to perform various tests under computer keyboard control. A wide variety of tests can be set up simply by manipulating the keyboard of the computer and the versatility of the system is still further increased by the possibility of plugging in the various kinds of test modules at different data ports and by interchanging the read-only memories of the microcomputer.