The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 1984
Filed:
Mar. 23, 1982
Applicant:
Inventors:
Bernard David, Gif-Sur-Yvette, FR;
Michel Pigeon, Bures Sur Yvette, FR;
Assignee:
Commissariat a l'Energie Atomique, Paris, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01R / ;
U.S. Cl.
CPC ...
324225 ; 324241 ; 324242 ; 324243 ;
Abstract
Process and device for non-destructive testing or inspection by eddy currents with correction of the air gap effects. A differential measurement and an absolute measurement are performed and the result of the former is divided by that of the latter, which supplies a signal with respect to which the effects of the air gap separating the probe from the member to be inspected are corrected. Application to the inspection and testing of metal members.