The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 1984
Filed:
Nov. 06, 1981
Benoit Grandjacques, Maisons Alfort, FR;
Jacques Moirez, Paris, FR;
Michel Saint-Sevin, Gagny, FR;
Michel Blot, Arpajon, FR;
Jean-Michel Baluteau, Livry Gargan, FR;
Sopelem, Levallois-Perret, FR;
Abstract
Refractometer for measuring the refractive index of a medium (2), using the limiting angle method. A source (4) illuminates a source slit (5) which has as its image with respect to an optical system (S) one of the parallel and regularly spaced slits (5') of a grille (6) fixed perpendicular to the optical axis each of the slits (5') corresponding to an angle of incidence of the optical beam on a prism (3). Turning of a rhombohedron causes the image (5') of the source slit (5) on the grille (6) to be successively on each of the slits (5') of the grille (6). The pupil (L.sub.1), located in the plane of the source, is conjugate with the exit face (8) of the prism (3) and remains stationary when the image (5') of the source slit (5) is moved over the grille (6).