The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 1984
Filed:
May. 24, 1983
Katsuhiko Sugita, Kanazawa, JP;
Tsutomu Sainen, Kanazawa, JP;
Tsudakoma Corp., Ishikawa, JP;
Abstract
The amplitude of a signal (original waveform) produced by weft sensors is relativized, and the signal waveform is analyzed in various aspects based on multiple parameters to discriminate a weft yarn and a jet of fluid accurately. More specifically, a discriminating function is calculated beforehand from a signal indicative of the weft yarn and jet of fluid under normal weft insertion conditions, and a signal produced in actual detection operation is compared with the discriminating function to determine whether the weft yarn is present or not. The discriminating function can be obtained by extracting feature parameters from a signal generated by the weft sensors, and relativizing the feature parameters with respect to the original signal waveform to find a reference quantity. The feature parameters include the original waveform per se, a differentiated value thereof, an integrated value thereof, frequencies in certain frequency ranges, and sampling averages of the above parameters. The parameter relativization is carried out by finding ratios and differences between the feature parameters. The discriminating function is created by a statistical method.