The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 1984

Filed:

May. 13, 1981
Applicant:
Inventor:

David M Stern, Merion Station, PA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F / ; G01R / ;
U.S. Cl.
CPC ...
7330 / ; 34087016 ; 364509 ; 377 19 ;
Abstract

An improved system for generating a signal representative of the level of a material having a dielectric constant within a vessel is disclosed. The system features use of a first probe for generating a signal indicative of the dielectric constant of the material which is divided into a signal varying with the level of the material whereby a compensated level signal irrespective of the actual dielectric constant is measured. In a preferred embodiment, a single integrator is used to perform the division operation whereby inaccuracies due to component variation including long-term drift are eliminated. The instrument is disclosed as functioning in a two-wire instrument system having low power requirements, permitting use of conventional signal limits. Means for calibrating the instrument in a fail-safe manner such that the operator is assured of proper calibration are disclosed, as is means whereby bridge circuits used to measure in the capacitance measurements supplied to the division circuit are both supplied by a single oscillator means, again increasing reliability and accuracy of the system.


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