The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 1984

Filed:

Apr. 05, 1982
Applicant:
Inventors:

Tadanari Inoue, Tokyo, JP;

Takao Asaka, Tokyo, JP;

Yuji Yamaguchi, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364720 ;
Abstract

A method and system for generation of a quadratic curve signal expressed by f(x, y)=0 nonparametrically on coordinates X, Y, wherein, when linear micro-coefficients in the directions x, y are points (x, y) are given as fx, fy, respectively, the signs of fx, fy are decided and fx, fy are compared for dimensions with each other, thereby limiting the point to be selected next, to two points; then the value of new f(x,y) obtainable through selecting each point, are calculated; absolute values of the new f(x, y) are compared, the point giving the smaller value being selected as the next point; and repeating the aforementioned procedure, thereby to generate a quadratic curve signal expressed by f(x, y)=0.


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