The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 1984
Filed:
Jan. 29, 1982
Peter C Pugsley, Pinner, GB;
Crosfield Electronics Limited, London, GB;
Abstract
In image reproduction, a method of preventing the reproduction of a defect in an area (74) of the image, which has been indicated as including a defect-containing region, comprises comparing pixel values in a region (A.sub.o) of the said area outside the defect-containing region (72) to ascertain the range of the values of picture elements in a defect-free line or region in the neighborhood of the defect-containing region. Next image values for picture elements in a portion (A.sub.1) of the defect-containing region are compared with the said range of values to ascertain whether any such picture element has a value differing sharply from the said range of values. Any sharply differing value is automatically replaced either by the value of a neighboring picture element in the defect-free line or region, or by the average value of a group of neighboring picture elements in the defect-free line or region, or by values having a similar mean value and similar variation to those in the neighboring defect-free region. Then the values of other picture elements in the defect-containing region are examined and those values which differ sharply from the said range of values are automatically replaced. The defect-containing region is progressively corrected in this way, preferably working from the boundary inwards (A.sub.1, A.sub.2, A.sub.3, A.sub.4) and preferably from each side (A, B, C, D) of a rectangle in turn. When all defects have been removed the stored signals are used to make the reproduction.