The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 1984
Filed:
Dec. 20, 1982
Patrick Michon, Jouy en Josas, FR;
Jean-Marie Vauchy, Saint-Cloud, FR;
Societe de Fabrication d'Instruments de Mesure, Massy, FR;
Abstract
The arrangement is of the type comprising: an optical sight (200) combined with an afocal opto-electronic unit (300). According to the invention the opto-electronic unit is located in front of the entry window (210) of the optical sight and the light rays emitted by a reticle (250) are guided from the optical sight (ABC) thus passing through its entry window (210), then towards the exit window (320) of the opto-electronic unit (CDEFG) in order to make the rays emitted by the reticle follow the same optical path (GHIJ) as the rays emitted by the object to be observed (400). The angular deviations produced by the addition of the opto-electronic unit are thus compensated for. In order to measure the magnification produced by this addition, the reticle (251,251') is split by a known value (1) the distance (1') between the images of this split reticle is then measured by a row of diodes (280), (FIG. 2).