The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 1984
Filed:
Oct. 18, 1982
Hitachi, Ltd., Tokyo, JP;
Abstract
An ultrasonic synthetic aperture testing apparatus comprises transmitting/receiving sections having an ultrasonic wave probe for transmitting and receiving ultrasonic waves at multiple points on the surface of a steel material, an operation section for accumulating the received signals corresponding to the distance between the multiple points and a reproduction point in a desired region of the material under testing, and a display section for displaying an image formed as a result of this accumulation operation. The ultrasonic wave probe is provided with vibrators corresponding to the respective vibration modes so that two kinds of ultrasonic waves in different vibration modes may be transmitted and received. The accumulation section is provided with a mechanism which performs accumulation and arithmetic operation for the two kinds of waves in different modes.