The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 1984

Filed:

Jul. 19, 1982
Applicant:
Inventors:

Yuichiro Asano, Chiba, JP;

Taira Suzuki, Ichihara, JP;

Tadashi Yabe, Chiba, JP;

Kunio Kurita, Chiba, JP;

Suehisa Ohga, Takarazuka, JP;

Akira Hirahashi, Kobe, JP;

Atsushi Momose, Takarazuka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ; 356-1 ; 358167 ; 250563 ;
Abstract

The invention relates to a method for determining the shape in a plane to be determined in atmosphere of scattering materials. The method includes the steps of irradiating light on a first line to be determined being imagined on the plane to be determined in the atmosphere of scattering materials to extract a first picture signal at the time of picking up the first line to be determined; at the same time, irradiating light on a second line to be determined being imagined at a position with a prescribed distance apart from the first line to be determined to extract a second picture signal at the time of picking up the second line to be determined; then, subtracting the second picture signal from the first picture signal to extract a fresh picture signal; and operating two-dimensional position coordinates of a first image of line to be determined on the picture in which the first line to be determined has been picked up on the basis of the fresh picture signal to extract three-dimensional position coordinates of the first line to be determined in the plane to be determined through coordinate conversion of the two-dimensional position coordinates. Further, the invention relates to a system in which the scattering materials are cleared away by jetting gas into the atmosphere of scattering materials prior to picking up of the lines to be determined.


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