The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 1984
Filed:
Jun. 17, 1982
Applicant:
Inventor:
David H Alman, Royal Oak, MI (US);
Assignee:
E. I. Du Pont de Nemours and Company, Wilmington, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356405 ;
Abstract
An improved method for instrumentally characterizing the optical properties of a surface containing metallic particles such as a paint containing metallic flakes by using multiangular spectrophotometric or colormetric measurements to derive color constants for the paint, wherein the improvement comprises using three multiangular measurements, preferably 15.degree., 45.degree. and 110.degree. as measured from the specular angle.
Alman, David. (1984). Three direction measurements for characterization of a surface (U.S. Patent No. 4479718). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4479718
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile