The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 1984
Filed:
Sep. 30, 1981
Applicant:
Inventor:
Peter G Hoerenz, Hartsdale, NY (US);
Assignee:
Carl-Zeiss-Stiftung, Heidenheim/Brenz, Oberkochen, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351211 ; 351221 ;
Abstract
The invention contemplates an operation microscope which incorporates an eye-fixation feature to enable a patient's eye (under microscope observation) to precisely maintain infinity focus and viewing alignment, either with the central axis of the microscope or at desired controllable offset therefrom. Embodiments are shown for incorporation of this feature both as part of the field-illumination optical system associated with the microscope, and otherwise, but nevertheless also utilizing part of the observational optical system of the microscope.