The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 1984

Filed:

Jan. 07, 1983
Applicant:
Inventor:

Martin M Gram, St. Louis Park, MN (US);

Assignee:

MTS Systems Corporation, Eden Prairie, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73781 ; 73826 ;
Abstract

A material testing apparatus for testing physical properties of a test specimen includes an improved crosshead member adjustably supported on spaced vertical columns and adapted to support a grip for a test specimen to be loaded along a load axis. The improved crosshead member includes a load measuring (load cell) section defined by four spaced-apart openings located symmetrically with respect to the load axis. As shown there are two openings on each side of the load axis. The openings extend through the crosshead member. The crosshead is reduced in thickness or cross section between the openings to raise the stress levels in the crosshead so that strain gages are applied directly to the measuring section and can be used to measure the load applied to a test specimen. The grips are supported on a surface that is perpendicular to the loading axis and which intersects or is supported substantially on the point where there is substantially no lateral stress (in direction between the support columns) during either tension or compression loading of the specimen.


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