The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 1984

Filed:

Mar. 08, 1982
Applicant:
Inventors:

Akisuke Naruse, Hitachi, JP;

Tatsukuma Hosono, Hitachi, JP;

Kazuo Takaku, Hitachi, JP;

Shigeru Kajiyama, Hitachi, JP;

Assignees:

Hitachi, Ltd., Tokyo, JP;

Hitachi Engineering Co., Ltd., Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G21C / ;
U.S. Cl.
CPC ...
73622 ; 73640 ; 376249 ; 376252 ;
Abstract

An ultrasonic flaw detector for detecting any flaw existing in the inner peripheral corner section of the joint portion between the barrel of a nuclear reactor pressure vessel and each of a plurality of cylindrical nozzles projecting from the barrel, by means of an ultrasonic wave applied from the outer peripheral corner section of the joint portion. The flaw detector has a probe pivotable around an axis which is made to follow up the locus of the center of curvature in the rounded surface of the outer peripheral corner section during the movement of the probe around the nozzle. According to this arrangement, it is possible to achieve a full automatic and remote control of the flaw detector except the attaching and detaching of the same, and to facilitate the processing of the signals representing the result of the flaw detection.


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