The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 1984

Filed:

May. 02, 1983
Applicant:
Inventor:

Willy Beinvogl, Munich, DE;

Assignee:

Siemens Aktiengesellschaft, Berlin & Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
156643 ; 156656 ; 156657 ; 156662 ; 2041 / ; 252 791 ;
Abstract

The invention provides a method of producing structures from double layers composed of a metal silicide (4) and polysilicon (3) on a silicon substrate (1) containing integrated semiconductor circuits in an operational plate reactor by reactive ion etching and with the use of a photosensitive resist mask (5) on the double layer to define desired structures. The plate reactor is provided with a controlled reactive gas mixture which contains fluorine and chlorine. The double layer (3, 4) in preferred embodiments is composed of a tantalum silicide layer and a polysilicon layer. An insulating layer (2) can be provided between the substrate and the double layer. The invention is useful for providing low-resistant interconnects in VLSI circuits.


Find Patent Forward Citations

Beinvogl, Willy. (1984). Method of producing structures from double layers of metal silicide and (U.S. Patent No. 4473436). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4473436

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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