The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 1984
Filed:
Jun. 18, 1982
Kazuo Sugai, Kitaibaraki, JP;
Yasuaki Sato, Hitachi, JP;
Hirotoshi Kino, Hitachi, JP;
Shuichi Hiruoka, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Engineering Co., Ltd., Tokyo, JP;
Abstract
An ultrasonic flaw detecting apparatus of electronically scanning type comprises a plurality of ultrasonic vibrator elements disposed in an arcuate array, wherein groups of N vibrator elements arrayed in the circumferential direction of an object under test are sequentially changed over to one another on one-by-one base to thereby scan an object under test with ultrasonic beams. By controlling phases of pulse signals applied to the individual vibrator elements, a region of focus of the ultrasonic beams is set at a predetermined depth of the object under test. For reception, only the echoes reflected from a predetermined focal range are selectively extracted by providing corresponding window or gate means.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile