The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 1984

Filed:

Feb. 22, 1983
Applicant:
Inventor:

Johannes T van de Ven, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G / ; H05G / ;
U.S. Cl.
CPC ...
378099 ; 358111 ; 378 97 ; 378108 ;
Abstract

In an X-ray examination apparatus comprising an image intensifier tube and an optical light distribution system there is included an image field selector, by means of which, using a subbeam diverted from the imaging beam, a measurement field can be selected and by means of which this measurement field or a boundary outline thereof can be projected back into the imaging radiation path. Thus, it is achieved that during an examination stage an indication of the extent and location of a measurement field which is considered to be relevant for controlling the desired exposure for pictures to be produced, can be constantly displayed on the image screen of the television monitor.


Find Patent Forward Citations

van de Ven, Johannes. (1984). X-ray examination apparatus (U.S. Patent No. 4472826). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4472826

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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