The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 1984
Filed:
Jun. 04, 1982
Christie G Enke, East Lansing, MI (US);
John F Holland, Lansing, MI (US);
John T Stults, East Lansing, MI (US);
Research Corporation, New York, NY (US);
Abstract
Time of flight mass spectrometry techniques are simultaneously combined with path-bending spatial dispersion in magnetic- or electric-sector mass spectrometers to improve the mass resolution or, with an ion fragmentation region, to rapidly obtain multidimensional mass spectral data previously only obtainable by tandem mass spectrometry. The instrumentation generates data defining relationships between parent ions and daughter ions produced by fragmentation, metastable or induced, data to differentiate stable from metastable ions, and data to improve mass resolution. The subject time-resolved mass spectrometers can be combined with chromatography apparatus to obtain multidimensional MS/MS-type data during the relatively short duration of a single chromatographic peak.