The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 1984
Filed:
Apr. 29, 1981
Sugio Manabe, Kodaira, JP;
Taiichi Banno, Hachioji, JP;
Nagahiro Gocho, Hachioji, JP;
Masahiko Sakurada, Machida, JP;
Ryoichi Orimo, Ohme, JP;
Olympus Optical Co. Ltd., , JP;
Abstract
A method of enhancing the accuracy and reliability of a chemical analysis, wherein a reaction is carried out by combining a sample liquid with at least one reagent to form a test liquid and the test liquid is photometrically scrutinized a plurality of times over an extended period of time to derive a number of photometric values. The derived values are then stored and a plurality of the stored photometric values are preliminarily selected from a given time frame, wherein the plurality of preliminarily selected values are less than a total number of stored photometric values. Successive preliminarily selected photometric values are compared with at least one predetermined standard to derive a comparison result and upon indication that useful data cannot be calculated from the preliminarily selected photometric values, a secondarily selecting step of selecting at least one photometric value from all of the stored photometric values, which were not preliminarily selected, is used to derive an analytical result which represents a concentration of a chemical substance in the test liquid or an activity of the test liquid.