The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 1984

Filed:

Sep. 08, 1981
Applicant:
Inventors:

Samuel G Williams, Los Angeles, CA (US);

Ning Wu, Rancho Palos Verdes, CA (US);

Brent L Ellerbroek, Los Angeles, CA (US);

Assignee:

Hughes Aircraft Company, El Segundo, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B / ; G01N / ; G03B / ;
U.S. Cl.
CPC ...
364525 ; 364151 ; 364551 ; 364559 ; 356138 ; 356392 ; 250201 ;
Abstract

A complex optical system may be maintained in alignment by means of a technique in which an analytical model of the system is utilized which is assumed to be capable of essentially optimal performance. A physical example of the same system design is then assembled and a plurality of performance characteristics are measured related to the intensity function associated with a point source image on the system's focal plane detector array. A plurality of specific adjustments are then calculated by means of a second order approximation technique which would have the effect of degrading the performance of the analytical model to equal that measured for the physical example, whereupon compensating physical adjustments are made to the physical example to improve its measured performance.


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