The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 1984
Filed:
Dec. 15, 1981
Lawrence E Crooks, Richmond, CA (US);
John C Hoenninger, III, Oakland, CA (US);
Mitsuaki Arakawa, San Mateo, CA (US);
The Regents of the University of Calif., Berkeley, CA (US);
Abstract
An imaging NMR scanner obtains plural spin echo signals during each of successive measurement cycles permitting determination of the T2 parameter for each display pixel after but a single measurement sequence. The amplitude of the NMR spin echo responses is dependent on an 'a' machine parameter (the elapsed time between initiation of a given measurement cycle and the occurrence of the NMR response) and upon a 'b' machine parameter (the elapsed time between initiation of successive measurement cycles). These a and b machine time parameters are selectively controlled to enhance resultant image contrast between different types of tissue or other internal structures of an object under examination. Special phase control circuits ensure the repeatability of relative phasing between successive NMR responses from the same measured volume and/or of reference RF signals utilized to frequency translate and synchronously demodulate the NMR responses in the successive measurement cycles of a complete measurement sequence. Special sub-sequences of four measurement cycles are utilized to provide resultant combined spin echo measurements substantially independent of FID signal components.