The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 1984
Filed:
May. 05, 1982
Applicant:
Inventors:
Soichi Ishikawa, Nagoya, JP;
Masaaki Tokui, Toyota, JP;
Assignee:
Toyota Jidosha Kogyo Kabushiki Kaisha, Aichi, JP;
Primary Examiner:
Int. Cl.
CPC ...
B22D / ;
U.S. Cl.
CPC ...
164457 ; 164150 ;
Abstract
A method of and an apparatus for inspecting the quality a casting produced by a die-casting machine, wherein a variety of the operating conditions are monitored in each casting process and thereby the quality of the casting can be judged immediately after the casting.
Ishikawa, Soichi. (1984). Method of and apparatus for inspecting the quality of a casting produced (U.S. Patent No. 4469164). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4469164
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile