The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 1984
Filed:
Jan. 19, 1981
Shunji Mori, Kashiwa, JP;
Hiromitsu Yamada, Sakura, JP;
Kunihiko Takeuchi, Kawasaki, JP;
Michihisa Do, Tokyo, JP;
Agency of Industrial Science and Technology, Tokyo, JP;
Tokyo Keiki Co., & Ltd., Tokyo, JP;
Totec Co., Ltd., Tokyo, JP;
Abstract
Disclosed is an extraction method for optical character recognition systems in which the necessary character features for recognition process are extracted from a character information detected and digitized by an optical scanner. In accordance with this method, the local features of every adjacent two rows or columns of a digitized character pattern on a two-dimensional plane are extracted row by row or column by column and are successively integrated so as to extract in a global manner the respective feature types such as concavity and convexity, loop and connectivity of the character pattern. At the same time, the global feature regions or segments are separated and each of the separated feature segments is coded without any loss of the information. The feature quantity of each segment is obtained on the basis of the coded representation. Any local concavity or convexity noises are eliminated simultaneously with the extraction of the global features.