The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 1984
Filed:
Mar. 17, 1981
Donald J Jenden, Malibu, CA (US);
Robert W Silverman, Los Angeles, CA (US);
Frederick C Lee, South Pasadena, CA (US);
The Regents of University of California, Berkeley, CA (US);
Abstract
Quantitative chromatography is widely used in many fields to measure the amount of a compound present in a mixture. A series of Gaussian-like peaks are generated as output, and the size is conventionally measured by peak area or peak height determinations. The microprocessor-based analysis system of the present invention is designed to 'learn' the characteristics of a set of chromatographic peaks. Retention time and peak width parameters are used to detect and measure selected peaks by a convolution procedure based on a matched filter. The filter is applied to peaks in the neighborhood of selecting peak times which have a shape closely resembling that of a control sample. The system is built around a microprocessor with a wide dynamic range analog-to-digital conversion input stage. Operator interaction with the programs and the printing of output results is facilitated.