The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 1984
Filed:
Feb. 12, 1982
John C Murphy, Columbia, MD (US);
Leonard C Aamodt, Silver Spring, MD (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
The present invention provides a thermal imaging method to evaluate the surface and subsurface properties of a material and is based on techniques of optical beam deflection thermal imaging. The invention uses a localized excitation source, such as an optical beam, to provide localized heating of the sample surface. A surface thermal gradient is induced on the sample surface as heat flows, in three dimensions, from the area of localized excitation into the test material. The surface temperature gradient causes a thermal refractive lens to be generated in the fluid (gas or liquid) adjacent to the sample surface. An optical probe beam is directed through the thermal lens and is deflected by changes in a refractive index of the thermal lens. Changes in the refractive index are induced by variations of the surface temperature. In this manner, a detailed surface temperature profile can be generated which reveals surface and subsurface properties of the material tested.