The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 1984

Filed:

Nov. 07, 1980
Applicant:
Inventor:

John W Miller, Toledo, OH (US);

Assignee:

Owens-Illinois, Inc., Toledo, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358106 ; 2502 / ; 250563 ; 356237 ; 356240 ;
Abstract

A control circuit for an apparatus for inspecting objects, such as glass bottles and the like, for defects includes an interface circuit connected between a source of data signals and means for processing information obtained from the object. The interface circuit receives the data signals, typically in digital series form, and includes a latch for storing one of the digital signals, a pair of adders, and a storage means for a plurality of threshold signals. Each data signal is compared to the preceding data signal stored in the latch in one of the adders to generate a difference signal representing the difference in magnitudes between the two signals. Each difference signal is compared with a selected one of the stored threshold signals in the other adder to generate an event signal representing the difference in magnitudes between the two signals. The means for processing information includes a pair of control units and a master control means for alternately connecting the control units to the interface means, whereby one of the control units is receiving a group of the event signals representing one object while the other control unit is processing a preceding group of the event signals.


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