The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 1984
Filed:
Jun. 28, 1982
Carl A Farren, Placentia, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
An improved source assembly for use in infrared gas analysis instruments. A rotating reflector having a generally conical shape is provided with a reflective interior surface. An infrared source directs infrared radiation against the reflector from a predetermined number of fixed directions each of which is generally perpendicular to its axis. One or more blocking members, which are aligned generally parallel to the axis of the reflector, pass between the source and the reflective surface as the reflector is rotated. In operation the source assembly generates a plurality of chopped beams of infrared radiation which, because they emanate from a single source and are reflected from the same reflective surface, have a highly uniform intensity. This uniformity of intensity allows the source assembly to illuminate a plurality of sample cells that are distributed circumferentially about the axis of the reflector. The result is an instrument having improved response at a cost that is less than that of a source assembly that includes multiple infrared sources.