The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 1984
Filed:
Jun. 03, 1981
Applicant:
Inventor:
Mitsuyoshi Sato, Tokyo, JP;
Assignee:
Seiko Instruments & Electronics Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250310 ; 378 49 ; 378 83 ;
Abstract
Macroanalyzer system comprising in combination: a crystal for separating X-ray emitted from a sample, an X-ray detector for detecting X-ray which are separated by the crystal, and a solar slit member located between the crystal, sample and X-ray detector. An operation circuit receives the output of said X-ray detector to eliminate the effect of the X-ray passing through the solar slit.