The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 1984
Filed:
Aug. 23, 1982
Applicant:
Inventors:
Cheng-Chung Huang, Sunnyvale, CA (US);
Tao Chang, Sunnyvale, CA (US);
Assignee:
Lockheed Missiles & Space Co., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356-45 ; 73657 ; 356 285 ; 356349 ;
Abstract
The disclosed heterodyne measurement apparatus utilizes a single coherent light source to simultaneously measure the location of a number of points on a surface. The coherent light is split into two parts by a Bragg Cell. One part, after being spatially split into a plurality of beams by a second Bragg Cell, fed to a plurality of reflectors on the surface, and recombined by the second Bragg Cell, is heterodyned with the second part. The heterodyned signal is fed to a photodetector and further processed to produce a signal representative to the distance to the points of interest on the surface.