The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 1984

Filed:

Nov. 18, 1981
Applicant:
Inventors:

Kiyofumi Matsuda, Ibaraki, JP;

Koji Tenjinbayashi, Ibaraki, JP;

Tsuguo Kohno, Tokorozawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H / ; G01B / ;
U.S. Cl.
CPC ...
350-36 ; 356138 ;
Abstract

A holographic straightness meter comprising an optical element and a hologram disposed on a moving member and one pair of reflection elements disposed on a fixed member. The object beam and reference beam from the optical element are reflected by the reflection elements so as to impinge upon the hologram and form interference fringes on the screen placed behind the hologram. The number, interval, and inclination of these interference fringes vary with the amount of lateral displacement of the moving member. Thus by analyzing the interference fringes for such factors, the amount of the lateral displacement of the moving member can be determined.


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