The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 1984

Filed:

Dec. 22, 1982
Applicant:
Inventors:

Robert E Baier, Eggertsville, NY (US);

Raymond W King, Buffalo, NY (US);

Anne E Meyer, N. Tonawanda, NY (US);

Assignee:

Calspan Corporation, Buffalo, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 612 ;
Abstract

A flow cell for monitoring accumulations of microscopic material in heat exchange systems and the like, by measuring accretion on the surfaces of a pair of plates exposed to a primary flow, includes a split housing which supports the pair of plates in closely spaced relation with an inlet and an outlet positioned to apply a primary flow between the plates, and further includes a cavity formed in each housing half with the back or opposite sides of the plates exposed to the interior of the cavity and fluid inlets and outlets leading into such cavities providing for the flow of a secondary fluid through the cavities and across the back sides of the plates for the purpose of more accurately simulating the thermal gradient conditions on the plates in a heat exchanger, and for monitoring the rate of accumulation on the plate surfaces.


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