The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 1984

Filed:

Apr. 05, 1982
Applicant:
Inventor:

James M Sokolich, Cliffside Park, NJ (US);

Assignee:

Allied Corporation, Morris Township, Morris County, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 / ; 3241 / ;
Abstract

Printed Circuit Board Testing Apparatus is disclosed which utilizes a 'bed of nails' of contacts with conductive probes mounted in an insulating plate on a grid of 0.050 inch spacing to make a plurality of electrical contacts with a printed circuit board under test. This large number of contacts are all connected to the edge of a plurality of printed circuit boards mounted perpendicular to the back of the plate. Paths on each of these printed circuit boards electrically connect the probes of the contacts to a large scale integrated circuit chip on which are a plurality of analog switches each controlled by one bit of a binary word stored in a multi-stage shift register also on the chip. One side of each switch is connected to a probe while the other side of the switches are tied together in busses to create a multiplexing arrangement to thereby connect ones of the large number of probes to a relatively small number of input/output leads also connected to the printed circuit boards. In operation, selected ones of the analog switches on each chip are operated by serially loading binary words into the shift register on each chip to thereby operate switches and connect the board under test via the input/output leads to test circuitry.


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