The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 1984
Filed:
Aug. 07, 1981
Viktor Bodlaj, Munich, DE;
Siemens Aktiengesellschaft, Berlin & Munich, DE;
Abstract
A method for correcting a measuring signal which has been generated by an apparatus measuring in contact-free fashion. The apparatus scans a surface to be measured with a light beam, measures the light reflected by the surface by means of an opto-electric detector installation, and generates the measuring signal in dependence upon one or more electrical signals emitted by the detector. In the case of the above-described apparatus, distortions of the electrical signal emitted by the detector, which distortions occur for example through non-uniform scattering ability of the surface to be measured, can result. These distortions lead to measurement errors. Such measurement errors are corrected in the simplest manner possible. For this purpose, the measuring signal is corrected in dependence upon a distortion of an electrical signal.