The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 1984

Filed:

Apr. 05, 1982
Applicant:
Inventor:

Frank W Lehan, Santa Barbara, CA (US);

Assignee:

System Development Corporation, Santa Monica, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06G / ;
U.S. Cl.
CPC ...
364554 ; 364572 ; 364724 ; 364825 ;
Abstract

Apparatus and a related method for generating an estimate of the current state of an information source based upon the observed current and previous states of a related signal and on estimates of the effects of noise. The apparatus includes a state change probability matrix defining the probabilities of all possible state changes that the source is capable of assuming, states, a noise model for generating a set of probabilities indicative of the likelihood that an observed value of the signal would have occurred if the source were in each of its possible states, and circuitry for combining the set of probabilities from the noise model with the set of probabilities from the state change matrix, to provide a probability distribution indicative of the current underlying value of the source. The apparatus also includes a normalization circuit to maintain the sum of the probabilities in the resultant distribution at unity, and an appropriate circuit for computing an estimate of the underlying source state from the probability distribution.


Find Patent Forward Citations

Loading…