The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 1984

Filed:

Dec. 15, 1981
Applicant:
Inventors:

Wilbur I Kaye, Corona Del Mar, CA (US);

Lilla S Sun, Seal Beach, CA (US);

John C Anderson, Burbank, CA (US);

Assignee:

Beckman Instruments, Inc., Fullerton, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C09K / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
2524081 ; 252-1 ; 2502521 ; 436-8 ; 436 19 ;
Abstract

A wavelength calibration solution comprising from about 0.025 to about 0.140 molar neodymium and from about 0.135 to about 0.550 molar samarium, wherein the neodymium is present as a neodymium ionized constituent and the samarium is present as a samarium ionized constituent. A method for checking the wavelength accuracy of spectrometers or spectrophotometers of the type comprising measuring the absorbance (A) or percent transmittance (% T) of a wavelength calibration check solution versus a blank at more than one wavelength. The method is characterized in that the above solution is employed therein as the wavelength calibration check solution.


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