The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 1984
Filed:
Sep. 17, 1981
Warren H Miller, Jr, Palm Bay, FL (US);
Wilson E Taylor, Palm Bay, FL (US);
Harris Corporation, Melbourne, FL (US);
Abstract
An optical measurement technique enables optical signal processing apparatus to eliminate the effects of environmental noise during scanning of a workpiece, wherein successive optical slices through the workpiece are obtained. The image samples derived by the scanning optics may not properly line up with one another, where there is relative vibrational motion between the workpiece and the scanning optics. To overcome this problem a reference marker/correlation scheme effectively aligns each of the picture slices of the workpiece relative to a stored reference marker by correlation, so that the composite of the adjacent samples of the stem accurately represents a picture of the workpiece.