The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 1984

Filed:

May. 20, 1981
Applicant:
Inventors:

Masanori Idesawa, Wako, JP;

Toyohiko Yatagai, Tokyo, JP;

Assignee:

Rikagaku Kenkyusho, Wako, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ; 350 9628 ;
Abstract

Disclosed is an apparatus for determining the position of a mark on an object to be determined in terms of configuration, movement or any other geometrical or physical condition, using a photosensitive element and a light reflecting body in such a combination that the reflecter intercepts and casts to the photo-sensitive area of the element the beam of light from the mark, which beam of light would, otherwise, travel apart from the photo-sensitive element, not falling thereon. Thus, the measuring range of the photo-sensitive element is apparently extended, or otherwise the accuracy with which the mark position is determined is substantially improved.


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