The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 1984

Filed:

Jul. 26, 1982
Applicant:
Inventor:

Willard T Patton, Moorestown, NJ (US);

Assignee:

RCA Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01Q / ;
U.S. Cl.
CPC ...
343360 ; 343372 ;
Abstract

A near-field data measurement technique which provides sufficient data to enable the resolution of array element characteristics which are localized within a circle having a radius less than 0.61.lambda. is disclosed. This allows phase correction of individual array elements having spacings substantially less than 0.61.lambda. during the alignment of a phase array in a near-field test system.


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