The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 1984

Filed:

Sep. 28, 1982
Applicant:
Inventor:

William W McFarland, Hutchinson, KS (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73588 ; 73620 ;
Abstract

Apparatus and method for calculating and displaying the location of a defect inside a test specimen which has been detected by angled, ultrasonic beam, nondestructive inspection techniques are disclosed.


Find Patent Forward Citations

McFarland, William. (1984). Calculating apparatus and method (U.S. Patent No. 4452080). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4452080

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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