The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 1984

Filed:

Dec. 01, 1980
Applicant:
Inventors:

Theodor W Hansch, Palo Alto, CA (US);

Bernard J Couillaud, Talence, FR;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S / ;
U.S. Cl.
CPC ...
372 32 ; 372 27 ; 372 29 ; 350394 ; 350393 ; 350385 ;
Abstract

Herein is disclosed a method of and apparatus for measuring optical frequency variations wherein linearly-polarized incident light generated by a tunable laser or the like is delivered to a passive resonant cavity incorporating a linear polarizer such as a Brewster plate so that the reflected light acquires a frequency-dependent elliptical polarization which can be detected by a simple polarization analyzer providing a signal correlated with the frequency variation of the laser. Such signal can be utilized as a feedback error signal to stabilize the laser frequency, or to adjust the cavity resonance. If the cavity is tunable, tuning thereof will in turn provide a precision method for tuning of the laser itself.


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