The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 1984

Filed:

Oct. 20, 1981
Applicant:
Inventors:

Shigeru Nakamura, Hachioji, JP;

Takeshi Maeda, Kokubunji, JP;

Toshimitsu Kaku, Hachioji, JP;

Yoshito Tsunoda, Mitaka, JP;

Wasao Takasugi, Higashiyamato, JP;

Tokuya Kaneda, Odawara, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 45 ; 250204 ;
Abstract

A focal position detecting optical apparatus wherein a light beam focused by a first optical system is irradiated on an object to be illuminated, focal point images are formed at two foci spaced apart from each other by a cylindrical lens disposed in a path of light beam reflected from the object, and a shielding element having a tip edge making an angle of approximately 45.degree. with an operating axis of the cylindrical lens is inserted at a site between the two foci and at which the light beam has a circular cross section to extract a portion of the light beam travelling between the two foci. The extracted portion is detected by two photodetectors disposed symmetrically with an axis lying in substantially the same direction as the tip edge, and the difference between outputs of the two photodetectors is produced for detection of an actual focal position of the first optical system.


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