The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 1984

Filed:

Jul. 14, 1981
Applicant:
Inventors:

Han-Jurgen Franz, Schopfheim, DE;

Volker Dreyer, Lorrah-Haagen, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F / ;
U.S. Cl.
CPC ...
7330 / ; 361284 ; 324 / ;
Abstract

Disclosed is a capacitance level measuring device comprised of a container whose level is to be measured and a probe inserted into and spaced from the container. The capacitance between the probe and container varies in relation to the level in the container. A capacitance measuring circuit determines the capacitance between the probe and container and thus indicates the level in the container. The integrity of the probe is verified by constructing the probe so as to include it in a series circuit, as well as the capacitance measuring circuit, and a lack of continuity in the probe is indicative of questionable probe integrity. The question as to the probe's integrity would indicate a questionable level indication from the capacitance measuring circuit. Various probe constructions are also disclosed.


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